Browsing by Subject "Scale validation"

Now showing 1 - 4 of 4
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    Maternal and paternal parenting styles as a whole: validation of the simple form of the Parenting Style Evaluation Scale
    (Universidad de Murcia. Servicio de Publicaciones, 2021) Balaguer, Álvaro; Benítez, Edgar; Fuente-Arias, Jesús de la; Osorio, Alfonso
    Oliva’s Escala para la Evaluación del Estilo Parental (EEEP) [Scale for the evaluation of parenting styles] asks adolescents about their parents’ education styles separately (“your father” and “your mother”) or in a combined way (“your parents”), but only the separated version has been tested for validity. The objective of this work was to carry out a validation of the combined version. A sample of 1507 adolescents, aged 12 to 18 years, was recruited. Exploratory and confirmatory factor analyses were run in two independent subsamples. Then, structural equation models (SEM) were run in order to test the association between the EEEP’s subscales and adolescent outcomes (optimism, pessimism, and academic achievement). Results showed a good fit of the instruments’ structure. Furthermore, the subscales showed associations with the outcomes. The EEEP can be reliably used in its combined form, which results in a reduction of items, often beneficial for research.
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    Open Access
    Maternal and paternal parenting styles as a whole: validation of the simple form of the Parenting Style Evaluation Scale
    (Universidad de Murcia. Servicio de Publicaciones, 2021) Balaguer, Álvaro; Benítez, Edgar; Fuente, Jesús de la; Osorio, Alfonso
    La Escala para la Evaluación del Estilo Parental (EEEP) pregunta a los adolescentes sobre los estilos educativos de sus padres por separado (“tu padre” y “tu madre”) o de forma conjunta (“tus padres”), pero solo se ha evaluado la validez en la versión por separado. El objetivo de este trabajo fue evaluar la validez de las inferencias de la versión conjunta. Se reclutó una muestra de 1507 adolescentes, de 12 a 18 años. Se realizaron análisis factoriales exploratorios y confirmatorios en dos submuestras independientes. Después se probó un modelo de ecuaciones estructurales para comprobar la asociación de las subescalas de la EEEP con desenlaces de los adolescentes (optimismo, pesimismo y resultados académicos). Los resultados muestran buenas medidas de ajuste de la estructura del instrumento. Además, las subescalas mostraron asociación con los desenlaces. La EEEP puede ser usada con fiabilidad en su forma conjunta, resultando en una reducción de ítems, los cual es a menudo beneficioso para la investigación.
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    Validation of the Job Crafting Scale in Latin American Workers
    (Universidad de Murcia. Servicio de Publicaciones, 2022) Gutiérrez Carvajal, Oscar Iván; Polo Vargas, Jean David; Vargas Montealegre, Alba Ruth; Zumárraga Espinosa, Marcos; Ramírez Ocaña, Ximena; Segovia Marin, Valeria; Calderín Salgado, Lina Margarita
    In this study, the psychometric properties of the Spanish version (Bakker et al., 2018) of the Job Crafting scale of Tims et al. (2012), was an-alyzed in a Latin American population. We applied the scale to a sample of 903 employees (42.6% women & 57.4% men) from Colombia and Ecua-dor. Reliability and validity were examined. The results of the confirmatory factor analysis showed an adequate fit both in Colombia (CFI = .916, TLI = .900, IFI = .917, RMSEA = .060) and in Ecuador (CFI = .918, TLI = .903, IFI = .919, RMSEA = .064), in the four-factor structure of the origi-nal scale. Evidence of validation, related to criterion for psychological well-being for the dimensions of increasing structural resources and increasing challenging demands, was found. The Spanish version of the scale demon-strates its usefulness for research in the Latin American context.
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    Validation of the Spanish version of the Technostress Creators Scale in Chilean Workers
    (Universidad de Murcia. Servicio de Publicaciones, 2022) Salazar Concha, Cristian; Ficapal Cusí, Pilar; Peñarroja, Vicente; Enache Zegheru, Mihaela
    The purpose of this study was to adapt and validate the Spanish version of the Technostress Creators Scale (TCS). The scale was adminis-tered to 1.047 Chilean professionals. The internal structure of the scale was tested by conducting exploratory and confirmatory factor analyses. The av-erage variance extracted (AVE) and the Fornell–Larcker criterion were used to examine convergent and discriminant validity, respectively. To in-vestigate concurrent validity, we focused on the relation between the TCS scale and role stress, which is a distinct, albeit conceptually related con-struct. Our findings supported a five-factor model consisting of 23 items distributed in five factors: techno-overload, techno-invasion, techno-complexity, techno-insecurity and techno-uncertainty. The Spanish version of the TCS had a high level of internal consistency, which was similar to the original scale. Appropriate evidence of concurrent validity was also shown. In addition, we conducted an international comparison of the re-search results with other relevant adaptations of the instrument reported in different cultural contexts. The results confirmed that the Spanish transla-tion of the TCS is a suitable instrument for measuring technostress and can contribute to an empirical examination of this phenomenon in Span-ish-speaking countries.